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arXiv:2602.14593

Generalized Zernike Phase-Contrast Imaging

Christian Dwyer, David M. Paganin

physics.opticsquant-phSubmitted Feb 16, 2026• Announced Feb 17, 2026• 0 citations
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Abstract

Zernike phase-contrast imaging is unique among imaging techniques in that it enables the upper limit of Fisher information allowed by quantum mechanics. Here we show that, in a departure from an ideal setting, using an incident beam of finite width, and a $π/2$ phase plate having a finite cutoff, the technique can still deliver $>95\%$ of the quantum limit. We point out that the Zernike method is, in principle, applicable to any incident beam. As an example, we sketch an approximate implementation of the method for an incident speckle beam, and show that it too can deliver $>95\%$ of the quantum limit.

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Zernike phase-contrast imaging is unique among imaging techniques in that it enables the upper limit of Fisher information allowed by quantum mechanics. Here we show that, in a departure from an ideal setting, using an incident beam of finite width, and a π/2π/2π/2 phase plate having a finite cutoff, the technique can still deliver >95%>95\%>95% of the quantum limit. We point out that the Zernike method is, in principle, applicable to any incident beam. As an example, we sketch an approximate implementation of the method for an incident speckle beam, and show that it too can deliver >95%>95\%>95% of the quantum limit.
Quantum entanglement and squeezing have significantly improved phase estimation and imaging in interferometric settings beyond the classical limits. However, for a wide class of non-interferometric phase imaging/retrieval methods vastly used in the classical domain, e.g., ptychography and diffractive imaging, a demonstration of quantum advantage is still missing. Here, we fill this gap by exploiting entanglement to enhance imaging of a pure phase object in a non-interferometric setting, only measuring the phase effect on the free-propagating field. This method, based on the so-called "transport of intensity equation", is quantitative since it provides the absolute value of the phase without prior knowledge of the object and operates in wide-field mode, so it does not need time-consuming raster scanning. Moreover, it does not require spatial and temporal coherence of the incident light. Besides a general improvement of the image quality at a fixed number of photons irradiated through the object, resulting in better discrimination of small details, we demonstrate a clear reduction of the uncertainty in the quantitative phase estimation. Although we provide an experimental demonstration of a specific scheme in the visible spectrum, this research also paves the way for applications at different wavelengths, e.g., X-ray imaging, where reducing the photon dose is of utmost importance.
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What are the ultimate limits of accuracy for techniques in transmission electron microscopy (TEM)? For example, for a given electron dose, what is the ultimate accuracy that can be achieved for the atomic structure of a material? And what determines this accuracy? In this work, we show how quantum estimation theory can be used to provide some quantitative answers to such “big” questions. Quantum estimation theory (also known as quantum metrology theory) is concerned with measurements made at the quantum level. In recent years, the theory has been applied to an increasingly broad range of scientific techniques [1,2]. Here, we apply it to the problem of multiple electron scattering from an atomic structure in a TEM [3]. We focus on cases where the parameters of interest are those which characterize the sample, an extremely relevant and very general scenario. We report the following: We have obtained a quantitative prediction of the ultimate accuracy allowed by quantum mechanics for the precision of atom coordinates within a sample. As expected, this ultimate precision is a function of the electron dose (among other factors), and so this result has important consequences for the precision achievable for the atomic structure of radiation-sensitive materials. We demonstrate that the ultimate (quantum) limit for a simultaneous estimation of multiple sample parameters can be achieved under the condition of weak electron scattering, such as when the phase-object or weak-phase-object approximation is applicable. We demonstrate that this same quantum limit cannot be achieved under the condition of strong multiple scattering, due to the incompatibility of the projection measurements required. Hence strong multiple scattering precludes the quantum limit (with few exceptions) - a fascinating result. In the theory, a TEM experiment (which could be imaging, diffraction, holography, etc.) is divided into three stages: the incident electron beam |ψ0⟩, the beam scattered by the sample S|ψ0⟩, and the beam incident on the electron detector AS|ψ0⟩. Here, S and A are mathematical operators that account, respectively, for the scattering by the sample and the post-sample electron optics (e.g., lens aberrations). This description applies to many TEM modalities, which allows the theory to make general predictions. Fig. 1 shows the specific case of TEM imaging. As will be shown, the quantum limit for an arbitrary set of sample parameters can be achieved by phase-contrast imaging under the Zernike phase condition. Fig. 2 shows a quantitative prediction of the ultimate precision achievable for the lateral coordinate of an atom in a material, as measured in the TEM. Higher doses allow better precision, as expected. For a given dose, better precision is possible for heavier atoms, and for lower beam energies. The results show a strong and unexpected "threshold" effect which occurs at the onset of the asymptotic regime (where the dose is high enough for the statistics to become Gaussian). Finally, while our main focus here is TEM, the generality of the theory means that several of our important conclusions extend to other techniques which utilize the scattering of coherent radiation, such as coherent x-ray scattering in a synchrotron and neutron scattering. Optics for TEM imaging, showing the mathematical notation relevant to this work. Ultimate limits for the precision of a (lateral) atom position measured using TEM. Results are shown for two representative atomic species and beam energies 30-300 keV. Squares and diamonds show results from maximum likelihood estimation (MLE) applied to Monte Carlo image simulations.