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arXiv:2601.00067

Automated electrostatic characterization of quantum dot devices in single- and bilayer heterostructures

Merritt P. R. Losert, Dario Denora, Barnaby van Straaten, Michael Chan, Stefan D. Oosterhout, Lucas Stehouwer, Giordano Scappucci, Menno Veldhorst, Justyna P. Zwolak

cond-mat.mes-hallcs.CVcs.ETcs.LGquant-phSubmitted Dec 31, 2025• Announced Jan 2, 2026
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Abstract

As quantum dot (QD)-based spin qubits advance toward larger, more complex device architectures, rapid, automated device characterization and data analysis tools become critical. The orientation and spacing of transition lines in a charge stability diagram (CSD) contain a fingerprint of a QD device's capacitive environment, making these measurements useful tools for device characterization. However, manually interpreting these features is time-consuming, error-prone, and impractical at scale. Here, we present an automated protocol for extracting underlying capacitive properties from CSDs. Our method integrates machine learning, image processing, and object detection to identify and track charge transitions across large datasets without manual labeling. We demonstrate this method using experimentally measured data from a strained-germanium single-quantum-well (planar) and a strained-germanium double-quantum-well (bilayer) QD device. Unlike for planar QD devices, CSDs in bilayer germanium heterostructure exhibit a larger set of transitions, including interlayer tunneling and distinct loading lines for the vertically stacked QDs, making them a powerful testbed for automation methods. By analyzing the properties of many CSDs, we can statistically estimate physically relevant quantities, like relative lever arms and capacitive couplings. Thus, our protocol enables rapid extraction of useful, nontrivial information about QD devices.

Comments
18 pages, 12 figures

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As quantum dot (QD)-based spin qubits advance toward larger, more complex device architectures, rapid, automated device characterization and data analysis tools become critical. The orientation and spacing of transition lines in a charge stability diagram (CSD) contain a fingerprint of a QD device's capacitive environment, making these measurements useful tools for device characterization. However, manually interpreting these features is time-consuming, error-prone, and impractical at scale. Here, we present an automated protocol for extracting underlying capacitive properties from CSDs. Our method integrates machine learning, image processing, and object detection to identify and track charge transitions across large datasets without manual labeling. We demonstrate this method using experimentally measured data from a strained-germanium single-quantum-well (planar) and a strained-germanium double-quantum-well (bilayer) QD device. Unlike for planar QD devices, CSDs in bilayer germanium heterostructure exhibit a larger set of transitions, including interlayer tunneling and distinct loading lines for the vertically stacked QDs, making them a powerful testbed for automation methods. By analyzing the properties of many CSDs, we can statistically estimate physically relevant quantities, like relative lever arms and capacitive couplings. Thus, our protocol enables rapid extraction of useful, nontrivial information about QD devices.
Efficiently characterizing quantum dot (QD) devices is a critical bottleneck when scaling quantum processors based on confined spins. Measuring high-resolution charge stability diagrams (or CSDs, data maps which crucially define the occupation of QDs) is time-consuming, particularly in emerging architectures where CSDs must be acquired with remote sensors that cannot probe the charge of the relevant dots directly. In this work, we present a generative approach to accelerate acquisition by reconstructing full CSDs from sparse measurements, using a conditional diffusion model. We evaluate our approach using two experimentally motivated masking strategies: uniform grid-based sampling, and line-cut sweeps. Our lightweight architecture, trained on approximately 9,000 examples, successfully reconstructs CSDs, maintaining key physically important features such as charge transition lines, from as little as 4\% of the total measured data. We compare the approach to interpolation methods, which fail when the task involves reconstructing large unmeasured regions. Our results demonstrate that generative models can significantly reduce the characterization overhead for quantum devices, and provides a robust path towards an experimental implementation.
Abstract Efficiently characterizing quantum dot (QD) devices is a critical bottleneck when scaling quantum processors based on confined spins. Measuring high-resolution charge stability diagrams (or CSDs, data maps which crucially define the occupation of QDs) is time-consuming, particularly in emerging architectures where CSDs must be acquired with remote sensors that cannot probe the charge of the relevant dots directly. In this work, we present a generative approach to accelerate acquisition by reconstructing full CSDs from sparse measurements, using a conditional diffusion model. We evaluate our approach using two experimentally motivated masking strategies: uniform grid-based sampling, and line-cut sweeps. Our lightweight architecture, trained on approximately 9000 examples, successfully reconstructs CSDs, maintaining key physically important features such as charge transition lines, from as little as 4% of the total measured data. We compare the approach to interpolation methods, which fail when the task involves reconstructing large unmeasured regions. Our results demonstrate that generative models can significantly reduce the characterization overhead for quantum devices, and provides a robust path towards an experimental implementation.
Gate-defined semiconductor quantum-dot (QD) arrays are a promising platform for quantum computing. However, their large configuration spaces and inherent measurement noise make device tuning time consuming and difficult to scale. Although machine-learning (ML) approaches for automated tuning have proliferated rapidly, a fair comparison of methods remains limited by inconsistent metrics and a lack of standardized labeled datasets. Here, we introduce Geometry-Informed ANNotator for Electrostatic Topologies (GAnnET), a physics- and geometry-informed algorithm that automatically generates probabilistic state labels for charge stability diagrams (CSDs) of double-QD systems. GAnnET constructs local geometric models of CSD structure and combines them into a global state map with calibrated confidence, eliminating the need for manual annotation. We validate GAnnET on simulated and experimental CSDs and demonstrate consistent labeling suitable for ML training and benchmarking. By enabling reproducible annotation of experimental data, GAnnET supports community benchmarking and scalable automated QD operation.
The performance and scalability of semiconductor quantum-dot (QD) qubits are limited by electrostatic drift and charge noise that shift operating points and destabilize qubit parameters. As systems expand to large one- and two-dimensional arrays, manual recalibration becomes impractical, creating a need for autonomous stabilization frameworks. Here, we introduce a method that uses the full network of charge-transition lines in repeatedly acquired double-quantum-dot charge stability diagrams (CSDs) as a multidimensional probe of the local electrostatic environment. By accurately tracking the motion of selected transitions in time, we detect voltage drifts, identify abrupt charge reconfigurations, and apply compensating updates to maintain stable operating conditions. We demonstrate our approach on a 10-QD device, showing robust stabilization and real-time diagnostic access to dot-specific noise processes. The high acquisition rate of radio-frequency reflectometry CSD measurements also enables time-domain noise spectroscopy, allowing the extraction of noise power spectral densities, the identification of two-level fluctuators, and the analysis of spatial noise correlations across the array. From our analysis, we find that the background noise at 100~μμμ\si{\hertz} is dominated by drift with a power law of 1/f21/f^21/f2, accompanied by a few dominant two-level fluctuators and an average linear correlation length of (188±38)(188 \pm 38)(188±38)~\si{\nano\meter} in the device. These capabilities form the basis of a scalable, autonomous calibration and characterization module for QD-based quantum processors, providing essential feedback for long-duration, high-fidelity qubit operations.
Scaling semiconductor quantum dot arrays toward fault-tolerant quantum computing requires efficient tuneup of spin qubits, a process that depends on the analysis of charge stability maps (CSMs) and remains largely manual. While machine learning has been widely applied to CSM analysis in reservoir-coupled devices, automated tuning in the increasingly important isolated-mode regime has received limited attention. In isolated-mode CSMs, charge transitions appear as near-vertical lines, making them well suited to compact, task-specific models. We present two convolutional neural networks with fewer than one million parameters, trained on CSMs collected from 32 silicon metal-oxide-semiconductor (SiMOS) double-quantum-dot devices measured at approximately 1 K using an automated cryogenic probing system. Sixteen devices were used for training and sixteen were held out to evaluate cross-device generalization against hand-labeled ground truth. CSMClassifier identifies charge instability and sensor artifacts, achieving 94% macro-averaged accuracy across three quality classes on 2,407 held-out images. ChargeLineNet localizes charge-transition lines and determines electron occupancy, achieving 95.3% exact line-count accuracy on 1,131 held-out images. Combined into a single pipeline, the models correctly determine electron occupancy for 93.8% of clean held-out images. Pre-training on synthetic images substantially improves label efficiency. Fine-tuning the pre-trained model on limited experimental data maintains over 90% accuracy, whereas training from scratch degrades significantly under the same conditions. Together, the two models occupy only 6.5 MB and process images in less than 60 ms on standard laboratory hardware, demonstrating a practical path toward scalable, automated characterization and tuneup of quantum-dot devices.
Spin qubits in quantum dots are a compelling platform for fault-tolerant quantum computing due to the potential to fabricate dense two-dimensional arrays with nearest neighbour couplings, a requirement to implement the surface code. However, due to the proximity of the surface gate electrodes, cross-coupling capacitances can be substantial, making it difficult to control each quantum dot independently. Increasing the number of quantum dots increases the complexity of the calibration process, which becomes impractical to do heuristically. Inspired by recent demonstrations of industrial-grade silicon quantum dot bilinear arrays, we develop a theoretical framework to mitigate the effect of cross-capacitances in 2x2 arrays of quantum dots and extend it to 2xN and NxN arrays. The method is based on extracting the gradients in gate-voltage space of different charge transitions in multiple two-dimensional charge stability diagrams to determine the system's virtual gates. To automate the process, we train an ensemble of regression models to extract the gradients from a Hough transformation of charge stability diagrams and validate the algorithm on simulated and experimental data of a 2x2 quantum dot array. Our method provides a completely automated tool to mitigate cross-capacitance effects in arrays of QDs which could be utilised to study variability in device electrostatics across large arrays.