Two-level system loss characterization of NbTi superconducting resonators on Si/SiO2 substrates
Bongkeon Kim, Yong‐Joo Doh
Superconducting coplanar waveguide (SCPW) resonators, key components for quantum computing and sensing applications, require a high internal quality factor ( Q i ) for effective qubit readout and quantum sensing applications. Minimizing two-level system (TLS) losses, particularly at material interfaces, is critical for gatemon and topological qubits operating at low temperatures and in high magnetic fields. NbTi, a superconducting alloy with a high upper critical field, enables SCPW resonators resilient to such conditions. We fabricated NbTi SCPW resonators on Si/SiO 2 substrates and systematically characterized their TLS-limited quality factors as functions of temperature and microwave photon number. Our results demonstrate that NbTi-based SCPWs on Si/SiO 2 substrates provide a promising platform for developing next-generation quantum circuits. • Successfully fabricated NbTi SCPW resonators on Si/SiO 2 substrates. • Characterized NbTi SCPW across temperature and photon ranges for quantum apps. • Achieved record TLS-limited quality factor Q TLS,0 = 9.21 × 10 4 for SCPW on Si/SiO 2 . • NbTi SCPW on Si/SiO 2 is promising for gatemon and topological qubits.
arXiv:2509.01447•Current Applied Physics•Oct 18, 2025•1 citation