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arXiv:2501.06172 · Physical Review Letters

Randomized Benchmarking with Non-Markovian Noise and Realistic Finite-Time Gates

Antoine Brillant, Peter Groszkowski, Alireza Seif, Jens Koch, Aashish A. Clerk

Published Jun 27, 2025• 5 citations
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Abstract

We analyze the impact of non-Markovian classical noise on single-qubit randomized benchmarking experiments, in a manner that explicitly models the realization of each gate via realistic finite-duration pulses. Our new framework exploits the random nature of each gate sequence to derive expressions for the full survival probability decay curve which are nonperturbative in the noise strength. In the presence of non-Markovian noise, our approach shows that the decay curve can exhibit a strong dependence on the gate implementation method, with regimes of both exponential and power law decays. We discuss how these effects can complicate the interpretation of a randomized benchmarking experiment, but also how to leverage them to probe non-Markovianity.

DOI
10.1103/tmfd-qc5q

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We analyze the impact of non-Markovian classical noise on single-qubit randomized benchmarking experiments, in a manner that explicitly models the realization of each gate via realistic finite-duration pulses. Our new framework exploits the random nature of each gate sequence to derive expressions for the full survival probability decay curve which are nonperturbative in the noise strength. In the presence of non-Markovian noise, our approach shows that the decay curve can exhibit a strong dependence on the gate implementation method, with regimes of both exponential and power law decays. We discuss how these effects can complicate the interpretation of a randomized benchmarking experiment, but also how to leverage them to probe non-Markovianity.
In non-Markovian systems, the current state of the system depends on the full or partial history of its past evolution. Owing to these time correlations, non-Markovian noise violates common assumptions in gate characterization protocols such as randomized benchmarking and gate-set tomography. Here, we perform a case study of the effects of a quantum non-Markovian bath on qubit randomized benchmarking experiments. We consider a model consisting of qubits coupled to a multimode bosonic bath. We apply unitary operations on the qubits, interspersed with brief interactions with the environment governed by a Hamiltonian. Allowing for non-Markovianity in the interactions leads to clear differences in the randomized benchmarking decay curves in this model, which we analyze in detail. The Markovian model’s decay is exponential as expected, whereas the model with non-Markovian interactions displays a much slower, almost polynomial, decay. We develop efficient numerical methods for this problem that we use to support our theoretical results. These results inform efforts on incorporating quantum non-Markovian noise in the characterization and benchmarking of quantum devices.
Randomized benchmarking (RB) returns a single decay parameter or gate error rate, but when the noise is gate-dependent that parameter is notoriously difficult to interpret. We study RB and related random-circuit benchmarks under small gate-local Markovian noise by factorizing each noisy gate into its ideal action followed by the exponential of a small error generator and then perturbing the RB L\mathscr{L}L matrix, which models the RB decay. For any low-error gate set that satisfies the requirements of RB (it is a sequence-asymptotic unitary 2-design), we show that Pauli-stochastic error rates contribute linearly to the RB decay parameter, while Hamiltonian error rates contribute through a gauge-invariant quadratic form. Pauli-correlation and active generators are absent from the linear term and enter only at higher order. For the single-qubit native gate set {Xπ/2,Yπ/2}\{X_{π/2},Y_{π/2}\}{Xπ/2​,Yπ/2​} we derive this quadratic form explicitly in terms of three first-order gauge-invariant (FOGI) coordinates: the two intrinsic over-rotations and one relational axis-tilt error. The resulting formula explains the dependence of DRB on the sampling distribution and the compilation dependence of CRB. These results turn RB decay rates into interpretable functions of experimentally meaningful elementary error rates.
The rapid progress in the development of quantum devices is in large part due to the availability of a wide range of characterization techniques allowing to probe, test and adjust them. Nevertheless, these methods often make use of approximations that hold in rather simplistic circumstances. In particular, assuming that error mechanisms stay constant in time and have no dependence in the past, is something that will be impossible to do as quantum processors continue scaling up in depth and size. We establish a theoretical framework for the Randomized Benchmarking protocol encompassing temporally-correlated, so-called non-Markovian noise, at the gate level, for any gate set belonging to a wide class of finite groups. We obtain a general expression for the Average Sequence Fidelity (ASF) and propose a way to obtain average gate fidelities of full non-Markovian noise processes. Moreover, we obtain conditions that are fulfilled when an ASF displays authentic non-Markovian deviations. Finally, we show that even though gate-dependence does not translate into a perturbative term within the ASF, as in the Markovian case, the non-Markovian sequence fidelity nevertheless remains stable under small gate-dependent perturbations.
Randomized benchmarking is a promising tool for characterizing the noise in experimental implementations of quantum systems. In this paper, we prove that the estimates produced by randomized benchmarking (both standard and interleaved) for arbitrary Markovian noise sources are remarkably precise by showing that the variance due to sampling random gate sequences is small. We discuss how to choose experimental parameters, in particular the number and lengths of random sequences, in order to characterize average gate errors with rigorous confidence bounds. We also show that randomized benchmarking can be used to reliably characterize time-dependent Markovian noise (e.g., when noise is due to a magnetic field with fluctuating strength). Moreover, we identify a necessary property for time-dependent noise that is violated by some sources of non-Markovian noise, which provides a test for non-Markovianity.
Estimating the features of noise is the first step in a chain of protocols that will someday lead to faulttolerant quantum computers.The randomized benchmarking (RB) protocol is designed with this exact mindset, estimating the average strength of noise in a quantum processor with relative ease in practice.However, RB, along with most other benchmarking and characterization methods, is limited in scope because it assumes that the noise is temporally uncorrelated (Markovian), which is increasingly evident not to be the case.Here, we combine the RB protocol with a recent framework describing non-Markovian quantum phenomena to derive a general analytical expression of the average sequence fidelity (ASF) for non-Markovian RB with the Clifford group.We show that one can identify non-Markovian features of the noise directly from the ASF through its deviations from the Markovian case, proposing a set of methods to collectively estimate these deviations, non-Markovian memory time scales, and diagnose (in)coherence of non-Markovian noise in a RB experiment.Finally, we demonstrate the efficacy of our proposal by means of several proof-of-principle examples.Our methods are directly implementable and pave the way for a better understanding of correlated noise in quantum processors.
We analyze randomized benchmarking for arbitrary gate-dependent noise and prove that the exact impact of gate-dependent noise can be described by a single perturbation term that decays exponentially with the sequence length. That is, the exact behavior of randomized benchmarking under general gate-dependent noise converges exponentially to a true exponential decay of exactly the same form as that predicted by previous analysis for gate-independent noise. Moreover, we show that the operational meaning of the decay parameter for gate-dependent noise is essentially unchanged, that is, we show that it quantifies the average fidelity of the noise between ideal gates. We numerically demonstrate that our analysis is valid for strongly gate-dependent noise models. We also show why alternative analyses do not provide a rigorous justification for the empirical success of randomized benchmarking with gate-dependent noise.