Abstract Engineering quantum devices requires reliable characterization of the quantum system, including qubits, quantum operations (also known as instruments) and the quantum noise. Recently, quantum gate set tomography (GST) has emerged as a powerful technique for self-consistently describing quantum states, gates, and measurements. However, non-Markovian correlations between the quantum system and environment impact the reliability of GST. To address this, we propose a self-consistent operational framework called instrument set tomography (IST) for non-Markovian GST. Based on the stochastic quantum process, the instrument set describes instruments and system-environment (SE) correlations. We introduce a linear inversion IST (LIST) to describe instruments and SE correlations without physical constraints. The disharmony of linear relationships between instruments is detected. Furthermore, we propose a physically constrained statistical method based on the maximum likelihood estimation for IST (MLE-IST) with adjustable dimensions. MLE-IST shows significant flexibility in adapting to different types of devices, such as noisy intermediate-scale quantum (NISQ) devices, by adjusting the model and constraints. Experimental results demonstrate the effectiveness and necessity of simultaneously describing instruments and SE correlations. Specifically, the LIST and MLE-IST obtains significant improvement on average square error reduction in the imperfect implemented simulations by orders of −23.77 and −6.21, respectively, compared to their comparative methods. Remarkably, real-chip experiments indicate that a polynomial number of parameters with respect to the Markovian order are sufficient to characterize non-Markovian quantum noise in current NISQ devices. Consequently, IST provides an essential and self-consistent framework for characterizing, benchmarking, and developing quantum devices in terms of the instrument set.
Abstract Engineering quantum devices requires reliable characterization of the quantum system, including qubits, quantum operations (also known as instruments) and the quantum noise. Recently, quantum gate set tomography (GST) has emerged as a powerful technique for self-consistently describing quantum states, gates, and measurements. However, non-Markovian correlations between the quantum system and environment impact the reliability of GST. To address this, we propose a self-consistent operational framework called instrument set tomography (IST) for non-Markovian GST. Based on the stochastic quantum process, the instrument set describes instruments and system-environment (SE) correlations. We introduce a linear inversion IST (LIST) to describe instruments and SE correlations without physical constraints. The disharmony of linear relationships between instruments is detected. Furthermore, we propose a physically constrained statistical method based on the maximum likelihood estimation for IST (MLE-IST) with adjustable dimensions. MLE-IST shows significant flexibility in adapting to different types of devices, such as noisy intermediate-scale quantum (NISQ) devices, by adjusting the model and constraints. Experimental results demonstrate the effectiveness and necessity of simultaneously describing instruments and SE correlations. Specifically, the LIST and MLE-IST obtains significant improvement on average square error reduction in the imperfect implemented simulations by orders of −23.77 and −6.21, respectively, compared to their comparative methods. Remarkably, real-chip experiments indicate that a polynomial number of parameters with respect to the Markovian order are sufficient to characterize non-Markovian quantum noise in current NISQ devices. Consequently, IST provides an essential and self-consistent framework for characterizing, benchmarking, and developing quantum devices in terms of the instrument set.
Engineering of quantum computers requires reliable characterization of qubits, quantum operations, and even the entire hardware. Quantum tomography is an indispensable framework in quantum characterization, verification, and validation (QCVV), which has been widely accepted by researchers. According to the tomographic target, quantum tomography can be categorized into quantum state tomography (QST), quantum process tomography (QPT), gate set tomography (GST), process tensor tomography (PTT), and instrument set tomography (IST). Standard quantum tomography toolkits generally consist of basic linear inverse methods and statistical maximum likelihood estimation (MLE) based methods. Furthermore, the performance of standard methods, including effectiveness and efficiency, has been further developed by exploiting Bayesian estimation, neural networks, matrix completion techniques, etc. In this review, we introduce the fundamental quantum tomography techniques, including QST, QPT, GST, PTT, and IST. We first introduce the details of basic linear inverse methods. Then, the framework of MLE methods with constraints is summarized. Finally, we briefly introduce recent further research in developing the performance of tomography. This review provides a primary getting-start in developing quantum tomography, which promotes quantum computer development.
Quantum error correction (QEC) can strongly suppress noise, but predicting whether a computation succeeds requires understanding not only how much effective noise persists after QEC, but what form that noise takes. To thoroughly characterize this noise, we introduce logical gate set tomography (``logical GST''). Logical GST produces detailed representations of noisy logical operations that can be used to derive higher-level metrics, such as gate fidelity and diamond distance, and to test for non-Markovian and coherent logical errors. We use logical GST to obtain the first full, self-consistent characterization of a universal single-qubit logical gate set, implemented in the seven-qubit Steane code using Quantinuum System Model H1, a 20-qubit trapped-ion quantum processor. In the experimental data from H1, logical GST identified predominantly logical Pauli-stochastic errors, found no evidence of logical non-Markovianity, and detected weak potential signatures of coherent logical error. By contrast, higher-shot datasets generated with Quantinuum's detailed system emulator, identify mechanisms for weak but statistically significant logical non-Markovianity and strong evidence of coherent logical error. Finally, we use logical GST to perform error attribution with the system emulator, revealing how specific physical error sources shape logical error mechanisms.
Abstract To progress in the characterization of noise for quantum computers, gate set tomography (GST) has emerged as a self-consistent protocol that accurately estimates noisy gates, state preparations, and measurements. In its original incarnation, GST improves estimation precision by applying gates sequentially, assuming the noise yields fixed completely-positive and trace-preserving (CPTP) maps independent of prior gate history. This ‘Markovian’ assumption can conflict with experiments, where time-correlated noise may induce non-Markovian dynamics, or slow drifts and cumulative calibration errors introduce context dependence, causing CP-divisible maps to vary with circuit depth. In this work, we address this issue for trapped-ion devices with phonon-mediated two-qubit gates. Using detailed microscopic modeling of high-fidelity light-shift gates, we tailor GST to capture the main source of context dependence: motional degrees of freedom. Rather than invalidating GST, context dependence can be incorporated into the gate-set parametrization, reducing sampling cost. Our results identify a promising research avenue that might be applicable to other platforms where microscopic modeling can be incorporated: the development of a context-aware GST.
Abstract Gate set tomography (GST) allows for a self-consistent characterization of noisy quantum information processors (QIPs). The standard device-agnostic approach treats the QIPs as black boxes that are only constrained by the laws of physics, attaining full generality at aconsiderable resource cost: numerous circuits built from the gate set must be run in order to amplify each of the gate set parameters. In this work, we show that a microscopic parametrization of quantum gates under time-correlated noise on the driving phase, motivated by recent experiments with trapped-ion gates, reduces the required resources enabling a more efficient version of GST. By making use of the formalism of filter functions over the noise spectral densities, we discuss the minimal parametrizations of the gate set that include the effect of finite correlation times and non-Markovian quantum evolutions during the individual gates. We compare the estimated gate sets obtained by our method and the standard long-sequence GST, discussing their accuracies in terms of established metrics, as well as showcasing the advantages of the parametrized approach in terms of the sampling complexity for specific examples.
As quantum devices make steady progress towards intermediate scale and fault-tolerant quantum computing, it is essential to develop rigorous and efficient measurement protocols that account for known sources of noise. Most existing quantum characterization protocols such as gate-set tomography and randomized benchmarking assume the noise acting on the qubits is Markovian. However, this assumption is often not valid, as for the case of 1/f charge noise or hyperfine nuclear spin noise. Here, we present a general framework for quantum process tomography (QPT) in the presence of time-correlated noise. We further introduce fidelity benchmarks that quantify the relative strength of different sources of Markovian and non-Markovian noise. As an application of our method, we perform a comparative theoretical and experimental analysis of silicon spin qubits. We first develop a detailed noise model that accounts for the dominant sources of noise and validate the model against experimental data. Applying our framework for time-correlated QPT, we find that the number of independent parameters needed to characterize one- and two-qubit gates can be compressed by 10× and 100× , respectively, when compared to the fully generic case. These compressions reduce the amount of tomographic measurements needed in experiment, while also significantly speeding up numerical simulations of noisy quantum circuit dynamics compared to time-dependent Hamiltonian simulation. Using this compressed noise model, we find good agreement between our theoretically predicted process fidelities and two-qubit interleaved randomized benchmarking fidelities of 99.8% measured in recent experiments on silicon spin qubits. More broadly, our formalism can be directly extended to develop efficient and scalable tuning protocols for high-fidelity control of large arrays of quantum devices with non-Markovian noise. Published by the American Physical Society 2024
Physical models of quantum gates can directly incorporate experimental degrees of freedom, such as laser power or microwave phase, but the forward simulation required to use these models can result in impractical overhead in computational time.In this poster, we develop a method for efficient, accurate interpolation of quantum process matrices over physical parameter space, and we apply our method to study the sensitivity of quantum applications at both the gate level and circuit level.We then implement an extension of gate-set tomography (GST) that provides a comprehensive view into the errors suffered by a quantum information processor.In its standard form, GST fits a general Markovian model to experimental data in terms of process matrices that are often difficult to interpret.Our extension to this method uses process matrices interpolated over physical parameters in the optimization loop of GST to directly estimate physical model parameters, providing a clear description of the errors in a quantum processor, while reducing the required number of GST sequences by orders of magnitude compared to its standard form.