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arXiv:2303.17223 · Nature Physics

Experimental super-Heisenberg quantum metrology with indefinite gate order

Peng Yin, Xiaobin Zhao, Yuxiang Yang, Yu Guo, Wen-Hao Zhang, Gongchu Li, Yong‐Jian Han, Bi‐Heng Liu, Jin‐Shi Xu, Giulio Chiribella, Geng Chen, Chuan‐Feng Li, Guang‐Can Guo

Published May 1, 2023• 64 citations
arXivHTMLPDF

Abstract

Abstract The Heisenberg limit, corresponding to a root mean square error vanishing as 1/N with the number N of independent processes probed in an experiment, is widely believed to be an ultimate limit to the precision of quantum metrology.In this work, we experimentally demonstrate a quantum metrology protocol surpassing Heisenberg limit by implementing indefinite (a superposition of) orders of two groups of independent processes. Each process creates a phase space displacement, and the precision to estimate the geometric phase introduced by a total number of 2N processes approaches the super-Heisenberg limit of 1/N2. In our setup, the polarization of a single photon coherently controls the order of displacements on the transverse modes of the radiation field, resulting into indefinite order and allowing us to outperform every setup where the displacements are probed in a definite order. Our experiment features a realization of coherent control over the order in a continuous-variable system, and can be applied to the measurement of various important parameters.

DOI
10.1038/s41567-023-02046-y

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Abstract The Heisenberg limit, corresponding to a root mean square error vanishing as 1/N with the number N of independent processes probed in an experiment, is widely believed to be an ultimate limit to the precision of quantum metrology.In this work, we experimentally demonstrate a quantum metrology protocol surpassing Heisenberg limit by implementing indefinite (a superposition of) orders of two groups of independent processes. Each process creates a phase space displacement, and the precision to estimate the geometric phase introduced by a total number of 2N processes approaches the super-Heisenberg limit of 1/N2. In our setup, the polarization of a single photon coherently controls the order of displacements on the transverse modes of the radiation field, resulting into indefinite order and allowing us to outperform every setup where the displacements are probed in a definite order. Our experiment features a realization of coherent control over the order in a continuous-variable system, and can be applied to the measurement of various important parameters.
We address the study of quantum metrology enhanced by indefinite causal order, demonstrating a quadratic advantage in the estimation of the product of two average displacements in a continuous variable system. We prove that no setup where the displacements are used in a fixed order can have root-mean-square error vanishing faster than the Heisenberg limit 1/N, where N is the number of displacements contributing to the average. In stark contrast, we show that a setup that probes the displacements in a superposition of two alternative orders yields a root-mean-square error vanishing with super-Heisenberg scaling 1/N^{2}, which we prove to be optimal among all superpositions of setups with definite causal order. Our result opens up the study of new measurement setups where quantum processes are probed in an indefinite order, and suggests enhanced tests of the canonical commutation relations, with potential applications to quantum gravity.
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Abstract The Heisenberg limit is acknowledged as the ultimate precision limit for parameter estimation in quantum metrology. Recent studies have demonstrated super-Heisenberg-scaling limits, where the root mean square errors of estimation decrease faster-than-linearly with the number of probes or evolution processes. This casts doubt on what the ultimate precision limit of quantum metrology really is and, in particular, whether there is a deeper connection with Heisenberg's uncertainty principle. By linking the dynamics of the metrological process with properties in parameter space, we construct a Heisenberg's uncertainty relation between the unknown parameter and its canonical momentum. We propose a novel quantum metrological scheme that utilizes a generating process with indefinite time direction to increase the canonical momentum nonlinearly. This approach achieves a nonlinear-scaling precision limit that improves quadratically with the increase in evolution time length or the number of processes, in accordance with Heisenberg's uncertainty relation. Then we experimentally demonstrate in quantum optical systems that this nonlinear-scaling enhancement can be achieved with a fixed amount of energy in the probes. Consequently, our results provide a deeper insight into the Heisenberg limit in quantum metrology, and shed new light on improving the precision of practical metrological and sensing tasks in realistic quantum systems.
We investigate the advantage of coherent superposition of two different coded channels in quantum metrology. In a continuous variable system, we show that the Heisenberg limit 1/ N can be beaten by the coherent superposition without the help of indefinite causal order. And in parameter estimation, we demonstrate that the strategy with the coherent superposition can perform better than the strategy with quantum switch which can generate indefinite causal order. We analytically obtain the general form of estimation precision in terms of the quantum Fisher information and further prove that the nonlinear Hamiltonian can improve the estimation precision and make the measurement uncertainty scale as 1/ N m for m ≥ 2. Our results can help to construct a high-precision measurement equipment, which can be applied to the detection of coupling strength and the test of time dilation and the modification of the canonical commutation relation.
A central challenge in quantum metrology is to effectively harness quantum resources to surpass classical precision bounds. Although recent studies suggest that the indefinite causal order may enable sensitivities to attain the super-Heisenberg scaling, the physical origins of such enhancements remain elusive. Here, we introduce the nilpotency index K\mathcal{K}K, which quantifies the depth of non-commutativity between operators during the encoding process, can act as a fundamental parameter governing quantum-enhanced sensing. We show that a finite K\mathcal{K}K yields an enhanced scaling of root-mean-square error as N−(1+K)N^{-(1+\mathcal{K})}N−(1+K). Meanwhile, the requirement for indefinite causal order arises only when the nested commutators become constant. Remarkably, in the limit K→∞\mathcal{K} \to \inftyK→∞, exponential precision scaling N−1e−NN^{-1}e^{-N}N−1e−N is achievable. We propose experimentally feasible protocols implementing these mechanisms, providing a systematic pathway towards practical quantum-enhanced metrology.
We explore the performance of the metrology scheme by employing a quantum time flip during encoding, a specific case of processes with indefinite time direction, which we refer to as indefinite time directed metrology ( ITDM ). In the case of single parameter estimation of a unitary, we demonstrate that our protocol can achieve Heisenberg scaling (1/N) with product probe states, surpassing the standard quantum limit (1/N) , where N is the number of particles in the probe. We establish this by computing the quantum Fisher information ( QFI ) which is a lower bound on the root mean square error occurred during parameter estimation. Although we analytically prove the optimality of the symmetric product probe state in ITDM , entangled probe states produce a higher QFI than optimal product probes without enhancing scaling, highlighting the non-essentiality of entanglement. For phase estimation, we propose a single-qubit measurement on the control qubit that accomplishes near-optimal Fisher information and eventually reaches Heisenberg scaling. Our findings reveal the best orientation of product probe states in every pertinent situation, emphasizing its independence from the parameter to be estimated in the limiting case. Furthermore, we illustrate the benefits of ITDM in noisy metrology, outperforming existing techniques in some situations.