arXiv:2212.00440 · National Science Review
Photoionisation detection of a single Er3+ ion with sub-100-ns time resolution
Yangbo Zhang, Wenda Fan, Jiliang Yang, Hao Guan, Qi Zhang, Xi Qin, Chang‐Kui Duan, Gabriele G. de Boo, Brett C. Johnson, Jeffrey Colin McCallum, Matthew J. Sellars, Sven M. J. Rogge, Chunming Yin, Jiangfeng Du
Abstract
Abstract Efficient detection of single optical centres in solids is essential for quantum information processing, sensing and single-photon generation applications. In this work, we use radio-frequency (RF) reflectometry to electrically detect the photoionisation induced by a single Er3+ ion in Si. The high bandwidth and sensitivity of the RF reflectometry provide sub-100-ns time resolution for the photoionisation detection. With this technique, the optically excited state lifetime of a single Er3+ ion in a Si nano-transistor is measured for the first time to be $0.49 \pm 0.04\ \mu$s. Our results demonstrate an efficient approach for detecting a charge state change induced by Er excitation and relaxation. This approach could be used for fast readout of other single optical centres in solids and is attractive for large-scale integrated optical quantum systems thanks to the multi-channel RF reflectometry demonstrated with frequency multiplexing techniques.