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arXiv:2106.06717 · Physical Review Applied

Emergence of Biased Errors in Imperfect Optical Circuits

Fulvio Flamini

Published Dec 15, 2021• 0 citations
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Abstract

We study the impact of experimental imperfections in integrated optical circuits. We discuss the emergence of a moderate biased error in path encoding, and investigate its correlation with properties of the optical paths. Our analysis connects and deepens previous studies in this direction, revealing potential issues in high-precision tests and optical implementations of machine learning.

DOI
10.1103/physrevapplied.16.064038

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