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arXiv:2010.11498 · Physical Review A

Randomized benchmarking in the presence of time-correlated dephasing noise

Jiaan Qi, Hui Khoon Ng

Published Feb 15, 2021• 8 citations
arXivHTMLPDF

Abstract

Randomized benchmarking (RB) has emerged as a popular and easy-to-implement experimental technique for gauging the quality of gate operations in quantum computing devices. A typical randomized benchmarking procedure identifies the exponential decay in the fidelity as the benchmarking sequence of gates increases in length, and the decay rate is used to estimate the fidelity of the gate. Our current theory of RB, based on the assumption of time-independent or static noise in the gates, predicts an exponential decay in the fidelity. Observed deviations from the standard exponential decay are usually attributed to some amount of time correlations in the noise, though the precise mechanisms for deviation have yet to be fully explored. In this paper, we examine this question of randomized benchmarking for time-correlated noise---specifically for time-correlated dephasing noise for exact solvability---and elucidate the circumstances in which a deviation from exponential decay can be expected, as well as point out situations where exponential decay prevails despite the presence of time correlations.

DOI
10.1103/physreva.103.022607

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Randomized benchmarking (RB) has emerged as a popular and easy-to-implement experimental technique for gauging the quality of gate operations in quantum computing devices. A typical randomized benchmarking procedure identifies the exponential decay in the fidelity as the benchmarking sequence of gates increases in length, and the decay rate is used to estimate the fidelity of the gate. Our current theory of RB, based on the assumption of time-independent or static noise in the gates, predicts an exponential decay in the fidelity. Observed deviations from the standard exponential decay are usually attributed to some amount of time correlations in the noise, though the precise mechanisms for deviation have yet to be fully explored. In this paper, we examine this question of randomized benchmarking for time-correlated noise---specifically for time-correlated dephasing noise for exact solvability---and elucidate the circumstances in which a deviation from exponential decay can be expected, as well as point out situations where exponential decay prevails despite the presence of time correlations.
Randomized benchmarking (RB) is a widely adopted protocol for estimating the average gate fidelity in quantum hardware. However, its standard formulation relies on the assumption of temporally uncorrelated noise, an assumption often violated in current devices. In this work, we derive analytic expressions for the average sequence fidelity (ASF) in the presence of temporally correlated (non-Markovian) noise with classical memory, including cases where such correlations originate from interactions with a quantum environment. We show how the ASF can be interpreted to extract meaningful benchmarking parameters under such noise and identify classes of interaction Hamiltonians that render temporal correlations completely invisible to RB. We further provide operational criteria for witnessing temporal correlations due to quantum memory through RB experiments. Importantly, while classical correlations may remain undetectable in the ASF data, they can nonetheless significantly affect worst-case errors quantified by the diamond norm, a metric central to fault-tolerant quantum computing. In particular, we demonstrate that temporal correlations may suppress worst-case errors, highlighting that temporal correlations may not always have detrimental effects on gate performance.
Estimating the features of noise is the first step in a chain of protocols that will someday lead to faulttolerant quantum computers.The randomized benchmarking (RB) protocol is designed with this exact mindset, estimating the average strength of noise in a quantum processor with relative ease in practice.However, RB, along with most other benchmarking and characterization methods, is limited in scope because it assumes that the noise is temporally uncorrelated (Markovian), which is increasingly evident not to be the case.Here, we combine the RB protocol with a recent framework describing non-Markovian quantum phenomena to derive a general analytical expression of the average sequence fidelity (ASF) for non-Markovian RB with the Clifford group.We show that one can identify non-Markovian features of the noise directly from the ASF through its deviations from the Markovian case, proposing a set of methods to collectively estimate these deviations, non-Markovian memory time scales, and diagnose (in)coherence of non-Markovian noise in a RB experiment.Finally, we demonstrate the efficacy of our proposal by means of several proof-of-principle examples.Our methods are directly implementable and pave the way for a better understanding of correlated noise in quantum processors.
Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB decay parameter p coincides with the decay parameter of the gate-set circuit fidelity , a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gate-set. We also prove that, in the limit of high-fidelity single-qubit experiments, the possible alarming disconnect between the average gate fidelity and RB experimental results is simply explained by a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these results also hold for higher dimensions.
Abstract A crucial task to obtain optimal and reliable quantum devices is to quantify their overall performance. The average fidelity of quantum gates is a particular figure of merit that can be estimated efficiently by randomized benchmarking (RB). However, the concept of gate-fidelity itself relies on the crucial assumption that noise behaves in a predictable, time-local, or so-called Markovian manner, whose breakdown can naturally become the leading source of errors as quantum devices scale in size and depth. We analytically show that error suppression techniques such as dynamical decoupling (DD) and Pauli-twirling can operationally Markovianize RB: (i) fast DD reduces non-Markovian RB to an exponential decay plus longer-time corrections, while on the other hand, (ii) Pauli-twirling generally does not affect the average, but (iii) it always suppresses the variance of such RB outputs. We demonstrate these effects numerically with a qubit noise model. Our results show that simple and efficient error suppression methods can simultaneously tame non-Markovian noise and allow for standard and reliable gate quality estimation, a fundamentally important task in the path toward fully functional quantum devices.
We analyze randomized benchmarking for arbitrary gate-dependent noise and prove that the exact impact of gate-dependent noise can be described by a single perturbation term that decays exponentially with the sequence length. That is, the exact behavior of randomized benchmarking under general gate-dependent noise converges exponentially to a true exponential decay of exactly the same form as that predicted by previous analysis for gate-independent noise. Moreover, we show that the operational meaning of the decay parameter for gate-dependent noise is essentially unchanged, that is, we show that it quantifies the average fidelity of the noise between ideal gates. We numerically demonstrate that our analysis is valid for strongly gate-dependent noise models. We also show why alternative analyses do not provide a rigorous justification for the empirical success of randomized benchmarking with gate-dependent noise.
We compute the expected randomized benchmarking sequence fidelity for a system subject to Gaussian time-correlated noise. For single qubit benchmarking we show that the expected sequence fidelity is given by the partition function of a long-range coupled spin-one Ising model, with each site in the Ising model corresponding to a free evolution interval. For d-state systems, the expected sequence fidelity is given by an Ising-like model partition function whose site variables are given by the weights of the adjoint representation of SU(d). A high effective temperature expansion for the partition function in the single qubit case shows decay of sequence fidelity varying from exponential for uncorrelated noise to a power law for quasistatic noise. Fitting an exponential to the sequence fidelity decay under correlated noise gives unreliable estimates of the average gate error rate.