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arXiv:1810.10042 · npj Quantum Information

Efficiently measuring a quantum device using machine learning

D. T. Lennon, H. Moon, L. C. Camenzind, Liuqi Yu, Dominik M. Zumbühl, G. A .D. Briggs, M. A. Osborne, Edward A. Laird, N. Ares

Published Sep 26, 2019• 58 citations
arXivHTMLPDF

Abstract

Abstract Scalable quantum technologies such as quantum computers will require very large numbers of quantum devices to be characterised and tuned. As the number of devices on chip increases, this task becomes ever more time-consuming, and will be intractable on a large scale without efficient automation. We present measurements on a quantum dot device performed by a machine learning algorithm in real time. The algorithm selects the most informative measurements to perform next by combining information theory with a probabilistic deep-generative model that can generate full-resolution reconstructions from scattered partial measurements. We demonstrate, for two different current map configurations that the algorithm outperforms standard grid scan techniques, reducing the number of measurements required by up to 4 times and the measurement time by 3.7 times. Our contribution goes beyond the use of machine learning for data search and analysis, and instead demonstrates the use of algorithms to automate measurements. This works lays the foundation for learning-based automated measurement of quantum devices.

DOI
10.1038/s41534-019-0193-4

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Abstract Scalable quantum technologies such as quantum computers will require very large numbers of quantum devices to be characterised and tuned. As the number of devices on chip increases, this task becomes ever more time-consuming, and will be intractable on a large scale without efficient automation. We present measurements on a quantum dot device performed by a machine learning algorithm in real time. The algorithm selects the most informative measurements to perform next by combining information theory with a probabilistic deep-generative model that can generate full-resolution reconstructions from scattered partial measurements. We demonstrate, for two different current map configurations that the algorithm outperforms standard grid scan techniques, reducing the number of measurements required by up to 4 times and the measurement time by 3.7 times. Our contribution goes beyond the use of machine learning for data search and analysis, and instead demonstrates the use of algorithms to automate measurements. This works lays the foundation for learning-based automated measurement of quantum devices.
Scalable quantum technologies such as quantum computers will require very large numbers of quantum devices to be characterised and tuned. As the number of devices on chip increases, this task becomes ever more time-consuming, and will be intractable on a large scale without efficient automation. We present measurements on a quantum dot device performed by a machine learning algorithm in real time. The algorithm selects the most informative measurements to perform next by combining information theory with a probabilistic deep-generative model that can generate full-resolution reconstructions from scattered partial measurements. We demonstrate, for two different current map configurations that the algorithm outperforms standard grid scan techniques, reducing the number of measurements required by up to 4 times and the measurement time by 3.7 times. Our contribution goes beyond the use of machine learning for data search and analysis, and instead demonstrates the use of algorithms to automate measurements. This works lays the foundation for learning-based automated measurement of quantum devices.
Abstract Recent progress in building large-scale quantum devices for exploring quantum computing and simulation has relied upon effective tools for achieving and maintaining good experimental parameters, i.e., tuning up devices. In many cases, including quantum dot-based architectures, the parameter space grows substantially with the number of qubits, and may become a limit to scalability. Fortunately, machine learning techniques for pattern recognition and image classification, using so-called deep neural networks, have shown surprising successes for computer-aided understanding of complex systems. We propose a new paradigm for fully automated experimental initialization through a closed-loop system relying on machine learning and optimization techniques. We use deep convolutional neural networks to characterize states and charge configurations of semiconductor quantum dot arrays when only measurements of a current−voltage characteristic of transport are available. For simplicity, we model a semiconductor nanowire connected to leads and capacitively coupled to depletion gates using the Thomas−Fermi approximation and Coulomb blockade physics. We then generate labeled training data for the neural networks, and find at least 90 % accuracy for charge and state identification for single and double dots. Using these characterization networks, we can then optimize the parameter space to achieve a desired configuration of the array, a technique we call “auto-tuning”. Finally, we show how such techniques can be implemented in an experimental setting by applying our approach to an experimental dataset, and outline further problems in this domain, from using charge sensing data to extensions to full one- and two-dimensional arrays, that can be tackled with machine learning.
Abstract The rapid development of quantum dot (QD) devices for quantum computing has necessitated more efficient and automated methods for device characterization and tuning. Many of the measurements acquired during the tuning process come in the form of images that need to be properly analyzed to guide the subsequent tuning steps. By design, features present in such images capture certain behaviors or states of the measured QD devices. When considered carefully, such features can aid the control and calibration of QD devices. An important example of such images are so-called triangle plots , which visually represent current flow and reveal characteristics important for QD device calibration. While image-based classification tools, such as convolutional neural networks (CNNs), can be used to verify whether a given measurement is good and thus warrants the initiation of the next phase of tuning, they do not provide any insights into how the device should be adjusted in the case of bad images. This is because CNNs sacrifice prediction and model intelligibility for high accuracy. To ameliorate this trade-off, a recent study introduced an image vectorization approach that relies on the Gabor wavelet transform (Schug et al 2024 Proc. XAI4Sci: Explainable Machine Learning for Sciences Workshop (AAAI 2024) (Vancouver, Canada) pp 1–6). Here we propose an alternative vectorization method that involves mathematical modeling of synthetic triangles to mimic the experimental data. Using explainable boosting machines, we show that this new method offers superior explainability of model prediction without sacrificing accuracy. This work demonstrates the feasibility and advantages of applying explainable machine learning techniques to the analysis of QD measurements, paving the way for further advances in automated and transparent QD device tuning.
Abstract Tuning gate-defined quantum dots for qubit operation is an often frustrating and time-consuming activity in spin qubit research due to inherent device variability and the complex interactions between dots. Furthermore, tuning these devices grows more complicated as quantum computers grow to utility-scale. Computer-automated and machine learning techniques are popular approaches to accelerate the tuning process. However, these techniques need to become much faster and more accurate to address the tuning of millions of qubits in utility-scale quantum computing. We examine the literature of computer-automated and machine learning spin qubit tuning algorithms, grouping the algorithms by similar tasks and analyzing them from a computer science perspective to keep necessary background knowledge of quantum computing/physics at a minimum. We look at which approaches seem propitious for scaling up to utility-scale systems and where computer scientists could potentially have the most impact.
Abstract Deep reinforcement learning is an emerging machine-learning approach that can teach a computer to learn from their actions and rewards similar to the way humans learn from experience. It offers many advantages in automating decision processes to navigate large parameter spaces. This paper proposes an approach to the efficient measurement of quantum devices based on deep reinforcement learning. We focus on double quantum dot devices, demonstrating the fully automatic identification of specific transport features called bias triangles. Measurements targeting these features are difficult to automate, since bias triangles are found in otherwise featureless regions of the parameter space. Our algorithm identifies bias triangles in a mean time of <30 min, and sometimes as little as 1 min. This approach, based on dueling deep Q-networks, can be adapted to a broad range of devices and target transport features. This is a crucial demonstration of the utility of deep reinforcement learning for decision making in the measurement and operation of quantum devices.
Semiconductor quantum dots are at the forefront of quantum device technology. One longstanding obstacle to scalability is that multidot systems require a lengthy, complex, experimental tuning process. Here the authors introduce a machine-learning-driven algorithm for automated tuning of quantum dots. By letting the algorithm learn from experimental data, they develop a procedure that uses a small set of measurements as its input, and then automatically tunes the double-dot system to the desired charge state. This constitutes a significant step toward fully automated operation of multidot quantum systems.