arXiv:1711.10232 · Journal of Physics Communications

Dispersion measurement method with down conversion process

Marta Misiaszek, Andrzej Gajewski, Piotr Kolenderski

Published Jun 14, 2018• 4 citations

Abstract

Proper characterization of nonlinear crystals is essential for designing single photon sources. We show a technique for dispersion characterization of a nonlinear material by making use of phase matching in the process of parametric down conversion. We use our procedure to improve the Sellmeier coefficients measured by another methods. Our method is demonstrated on an exemplary periodically poled potassium titanyl phosphate KTiOPO 4 crystal phase-matched for 396 nm to 532 nm and 1550 nm. We show a procedure to characterize the dispersion in the range of 390 to 1800 nm by means of only one spectrometer for the UV–visible range.

DOI: 10.1088/2399-6528/aaccac

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