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arXiv:1406.1778

Ion-trap electrode preparation with Ne$^+$ bombardment

Kyle S. McKay, Dustin A. Hite, Yves Colombe, Robert Jördens, A. C. Wilson, D. H. Slichter, D. T. C. Allcock, Dietrich G. Leibfried, D. J. Wineland, Pappas, D. P.

Published Jun 6, 2014• 8 citations
arXivHTMLPDF

Abstract

We describe an ex-situ surface-cleaning procedure that is shown to reduce motional heating from ion-trap electrodes. This precleaning treatment, to be implemented immediately before the final assembly and vacuum processing of ion traps, removes surface contaminants remaining after the electrode-fabrication process. We incorporate a multi-angle ion-bombardment treatment intended to clean the electrode surfaces and interelectrode gaps of microfabricated traps. This procedure helps to minimize redeposition in the gaps between electrodes that can cause electrical shorts. We report heating rates in a stylus-type ion trap prepared in this way that are lower by one order of magnitude compared to a similar untreated stylus-type trap using the same experimental setup.

DOI
10.48550/arxiv.1406.1778

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Review of Scientific Instruments•Aug 1, 2013•25 citations
Ion-trap electrode preparation with Ne+^++ bombardment
We describe an ex-situ surface-cleaning procedure that is shown to reduce motional heating from ion-trap electrodes. This precleaning treatment, to be implemented immediately before the final assembly and vacuum processing of ion traps, removes surface contaminants remaining after the electrode-fabrication process. We incorporate a multi-angle ion-bombardment treatment intended to clean the electrode surfaces and interelectrode gaps of microfabricated traps. This procedure helps to minimize redeposition in the gaps between electrodes that can cause electrical shorts. We report heating rates in a stylus-type ion trap prepared in this way that are lower by one order of magnitude compared to a similar untreated stylus-type trap using the same experimental setup.
Motional heating of trapped atomic ions is a major obstacle to their use as quantum bits in a scalable quantum computer. The detailed physical origin of this heating is not well understood, but experimental evidence suggests that it is caused by electric-field noise emanating from the surface of the trap electrodes. In this study, we have investigated the role of adsorbates on the electrodes by identifying contaminant overlayers, implementing an in situ argon-ion-beam cleaning treatment, and measuring ion heating rates before and after treating the trap electrodes' surfaces. We find a 100-fold reduction in heating rate after treatment. The experiments described here are sensitive to low levels of electric-field noise in the MHz frequency range. Therefore, this approach could become a useful tool in surface science that complements established techniques.
Anomalous motional heating is a major obstacle to scalable quantum information processing with trapped ions. Although the source of this heating is not yet understood, several previous studies suggest that noise due to surface contaminants is the limiting heating mechanism in some instances. We demonstrate an improvement by a factor of 4 in the room-temperature heating rate of a niobium surface electrode trap by in situ plasma cleaning of the trap surface. This surface treatment was performed with a simple homebuilt coil assembly and commercially available matching network and is considerably gentler than other treatments, such as ion milling or laser cleaning, that have previously been shown to improve ion heating rates. We do not see an improvement in the heating rate when the trap is operated at cryogenic temperatures, pointing to a role of thermally activated surface contaminants in motional heating whose activity may freeze out at low temperatures.
Electric-field noise near ion-trap electrodes limits motional coherence and represents a key obstacle to scaling trapped-ion quantum systems. Here, we investigate how in situ Ar+ sputtering modifies motional heating and dephasing in multi-material surface-electrode traps. Trapped ions serve as local probes of electric-field fluctuations before and after controlled sputtering cycles. The data reveal a non-monotonic dependence of both the dephasing rate and the electric-field noise on the extent of Ar+ sputtering, with coherence initially improving while heating rates increase, followed by a reversal at longer exposures. This behavior highlights the intricate balance between beneficial surface cleaning and detrimental structural modification, driven by changes in surface morphology, redeposition of sputtered material, and diffusion on the surface, underscoring the complex interplay between surface composition and motional stability in multi-material electrode systems. Post-treatment scanning electron microscopy and energy-dispersive X-ray spectroscopy confirm significant modification of the multilayer structure. Technical noise was independently verified to be well below the observed levels. These findings indicate that in situ sputtering modifies surface properties in ways that can either mitigate or enhance electric-field noise, underscoring the need for precise control of material interfaces in next-generation ion-trap architectures.
In this thesis, the construction and implementation of an in situ plasma discharge designed to remove surface contaminants from electrodes in an ion trapping experimental system is presented with results. In recent years, many advances have been made in using ion traps for quantum information processing. All of the criteria defined by DiVincenzo for using ion traps for implementing a quantum computer have been individually demonstrated, and in particular surface traps provide a scalable platform for ions. In order to be used for quantum algorithms, trapped ions need to be cooled to their motional (quantum mechanical) ground state. One of the hurdles in integrating surface ion traps for a quantum computer is minimizing electric field noise, which causes the ion to heat out of its motional ground state and which increases with smaller ion-to-electrode distances realized with surface traps. Surface contamination of trap electrodes is speculated to be the primary source of electric field noise. The main goal achieved by this work was to implement an in situ surface cleaning solution for surface electrode ion traps, which would not modify the ion trap electrode surface metal. Care was taken in applying the RF power in order to localize a plasma near the trap electrodes. A method for characterizing the energy of the plasma ions arriving at the ion trap surface is presented and results for plasma ion energies are shown. Finally, a method for quantifying the effectiveness of plasma cleaning of trap electrodes, using the surface analysis technique of X-ray photoelectron spectroscopy for measuring the amount and kind of surface contaminants, is described. A significant advantage of the trap electrode surface cleaning method presented here is the minimal changes necessary for implementation on a working ion trap experimental system.
Laser cleaning of the electrodes in a planar micro-fabricated ion trap has been attempted using ns pulses from a tripled Nd:YAG laser at 355 nm.The effect of the laser pulses at several energy density levels has been tested by measuring the heating rate of a single 40 Ca + trapped ion as a function of its secular frequency ω z .A reduction of the electric-field noise spectral density by ∼50% has been observed and a change in the frequency dependence also noticed.This is the first reported experiment where the 'anomalous heating' phenomenon has been reduced by removing the source as opposed to reducing its thermal driving by cryogenic cooling.This technique may open up the way to better control of the electrode surface quality in ion microtraps.The recent success of quantum information experiments based on trapped ions [1] triggered research on micro-fabricated radio-frequency (Paul) traps, which are in principle able to fulfill the scalability requirement of a quantum computer [2,3].In such traps, a set of micro-fabricated conducting electrodes generates oscillating and static electric fields that trap laser-cooled ions in a harmonic potential well at a sub-millimeter distance d from the substrate [4,5].However, the presence of uncontrolled fluctuating electric fields affects the ions' external motion and induces an 'anomalous heating' that limits the achievable fidelity of multi-ion quantum gates that rely on the coherent control of this motion [6].Experimental observations concerning this phenomenon 4
An electroformed, three-dimensional stylus Paul trap was designed to confine a single atomic ion for use as a sensor to probe the electric-field noise of proximate surfaces. The trap was microfabricated with the UV-LIGA technique to reduce the distance of the ion from the surface of interest. We detail the fabrication process used to produce a 150 μm tall stylus trap with feature sizes of 40 μm. We confined single, laser-cooled, (25)Mg(+) ions with lifetimes greater than 2 h above the stylus trap in an ultra-high-vacuum environment. After cooling a motional mode of the ion at 4 MHz close to its ground state (<n> = 0.34 ± 0.07), the heating rate of the trap was measured with Raman sideband spectroscopy to be 387 ± 15 quanta/s at an ion height of 62 μm above the stylus electrodes.