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arXiv:1308.2527 · Physical Review Letters

Multicolor Quantum Metrology with Entangled Photons

Bryn A. Bell, Srikanth Kannan, Alex R. McMillan, Alex S. Clark, W. J. Wadsworth, John Rarity

Published Aug 29, 2013• 46 citations
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Abstract

Entangled photons can be used to make measurements with an accuracy beyond that possible with classical light. While most implementations of quantum metrology have used states made up of a single color of photons, we show that entangled states of two colors can show supersensitivity to optical phase and path length by using a photonic crystal fiber source of photon pairs inside an interferometer. This setup is relatively simple and robust to experimental imperfections. We demonstrate sensitivity beyond the standard quantum limit and show superresolved interference fringes using entangled states of two, four, and six photons.

DOI
10.1103/physrevlett.111.093603

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Entangled photons can be used to make measurements with an accuracy beyond that possible with classical light. While most implementations of quantum metrology have used states made up of a single color of photons, we show that entangled states of two colors can show supersensitivity to optical phase and path length by using a photonic crystal fiber source of photon pairs inside an interferometer. This setup is relatively simple and robust to experimental imperfections. We demonstrate sensitivity beyond the standard quantum limit and show superresolved interference fringes using entangled states of two, four, and six photons.
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Quantum entanglement can help to increase the precision of optical phase measurements beyond the standard quantum limit (SQL) to the ultimate Heisenberg limit [1, 2]. However, the N-photon parity measurements required to achieve this optimal sensitivity are extremely difficult to realize with current photon detection technologies, requiring high-fidelity resolution of N + 1 different photon distributions between the output ports. Recent experimental demonstrations of precision beyond the SQL for two[3–5] and four[6–9] photons have therefore used only one or two photon-number detection patterns instead of parity measurements. Here we investigate the achievable phase sensitivity of the simple and efficient single interference fringe detection technique. We show that the maximally-entangled NOON[10] state does not achieve optimal phase sensitivity when N > 4, rather, the Holland-Burnett state[11] is optimal. We experimentally demonstrate this enhanced sensitivity using a single photon-counted fringe of the six-photon Holland-Burnett state. Specifically, our single-fringe six-photon measurement achieves a phase variance three times below the SQL.
Generating quantum entanglement is not only an important scientific endeavor, but will be essential to realizing quantum-enhanced technologies, in particular, quantum-enhanced measurements with precision beyond classical limits. We investigate the heralded generation of multiphoton entanglement for quantum metrology using a reconfigurable integrated waveguide device in which projective measurement of auxiliary photons heralds the generation of path-entangled states. We use four and six-photon inputs, to analyze the heralding process of two- and four-photon NOON states-a superposition of N photons in two paths, capable of enabling phase supersensitive measurements at the Heisenberg limit. Realistic devices will include imperfections; as part of the heralded state preparation, we demonstrate phase superresolution within our chip with a state that is more robust to photon loss.
We demonstrate optical interferometry beyond the limits imposed by the photon wavelength using 'triggered' entangled photon pairs from a semiconductor quantum dot. Interference fringes of the entangled biphoton state reveals a periodicity half of that obtained with the single photon, and much less than that of the pump laser. High fringe visibility indicates that biphoton interference is less sensitive to decoherence than interference of two sequential single photons. The results suggest that quantum interferometry may be possible using a semiconductor LED-like device. (C) 2007 Optical Society of America