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arXiv:1205.4331 · Europhysics Letters (EPL)

On entanglement evolution across defects in critical chains

Viktor Eisler, Ingo Peschel

Published Jul 1, 2012• 82 citations
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Abstract

We consider a local quench where two free-fermion half-chains are coupled via a defect. We show that the logarithmic increase of the entanglement entropy is governed by the same effective central charge which appears in the ground-state properties and which is known exactly. For unequal initial filling of the half-chains, we determine the linear increase of the entanglement entropy.

DOI
10.1209/0295-5075/99/20001

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We consider a local quench where two free-fermion half-chains are coupled via a defect. We show that the logarithmic increase of the entanglement entropy is governed by the same effective central charge which appears in the ground-state properties and which is known exactly. For unequal initial filling of the half-chains, we determine the linear increase of the entanglement entropy.
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Abstract We consider a quench in a free-fermion chain by joining two homogeneous half-chains via a defect. The time evolution of the entanglement negativity is studied between adjacent segments surrounding the defect. In case of equal initial fillings, the negativity grows logarithmically in time and essentially equals one-half of the Rényi mutual information with index α = 1/2 in the limit of large segments. In sharp contrast, in the biased case one finds a linear increase followed by the saturation at an extensive value for both quantities, which is due to the backscattering from the defect and can be reproduced in a quasiparticle picture. Furthermore, a closer inspection of the subleading corrections reveals that the negativity and the mutual information have a small but finite difference in the steady state. Finally, we also study a similar quench in the XXZ spin chain via density-matrix renormalization group methods and compare the results for the negativity to the fermionic case.
The quantum Ising chain of length, LLL, which is separated into two parts by localized or extended defects is considered at the critical point where scaling of the interface magnetization is nonuniversal. We measure the entanglement entropy between the two halves of the system in equilibrium, as well as after a quench, when the interaction at the interface is changed for time t>0t>0t>0. For the localized defect the increase in the entropy with log L\text{log}\text{ }Llog L or with log t\text{log}\text{ }tlog t involves the same effective central charge, which is a continuous function of the strength of the defect. On the contrary for the extended defect the equilibrium entropy is saturated but the nonequilibrium entropy has a logarithmic time dependence the prefactor of which depends on the strength of the defect.
Abstract We study the half-chain entanglement entropy in the ground state of the spin-1/2 XX chain across an extended random defect, where the strength of disorder decays with the distance from the interface algebraically as Δ l ∼ l − κ . In the whole regime κ ⩾ 0 , the average entanglement entropy is found to increase logarithmically with the system size L as S L ≃ c e f f ( κ ) 6 ln ⁡ L + c o n s t , where the effective central charge c e f f ( κ ) depends on κ . In the regime κ < 1 / 2 , where the extended defect is a relevant perturbation, the strong-disorder renormalization group method gives c e f f ( κ ) = ( 1 − 2 κ ) ln ⁡ 2 , while, in the regime κ ⩾ 1 / 2 , where the extended defect is irrelevant in the bulk, numerical results indicate a non-zero effective central charge, which increases with κ . The variation of c e f f ( κ ) is thus found to be non-monotonic and discontinuous at κ